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Techniques

The EAG SMART (Spectroscopy and Microscopy Analytical Resolution Tool) Chart shown below offers a concise visual reference for comparing analytical techniques. Easily compare the detection limits and analytical resolutions of dozens of techniques used for materials characterization, evaluation surface analysis, purity surveys and more. 

 

Smart Chart

液相色谱 - 串联质谱 (LC-MS-MS)

LC-MS/MS combines LC's separation with triple quadrupole MS/MS's high sensitivity and selectivity for powerful analysis.

液相色谱 - 串联质谱 (LC-MS-MS)
>
原子探针断层扫描（APT）

APT enables 3D nanoscale imaging & chemical analysis with high sensitivity.

原子探针断层扫描（APT）
>
紫外/可见/近红外光谱（UV/ VIS/NIR）

UV-Vis-NIR spectroscopy analyzes optical properties of liquids/solids for material characterization.

紫外/可见/近红外光谱（UV/ VIS/NIR）
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电子能量损失谱（EELS）

EELS coupled with TEM/STEM provides nanoscale elemental analysis.

电子能量损失谱（EELS）
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电子束感应电流（EBIC）

EBIC is an SEM-based technique for semiconductor device analysis.

电子束感应电流（EBIC）
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X射线反射率（XRR）

XRR, an XRD-related technique, characterizes thin films & multilayers.

X射线反射率（XRR）
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卢瑟福背散射光谱法（RBS）

RBS is an ion-scattering technique for thin-film compositional analysis.

卢瑟福背散射光谱法（RBS）
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飞行时间二次离子质谱（TOF-SIMS）

TOF-SIMS: A surface analysis technique using pulsed ion beams to generate secondary ions during sputtering.

飞行时间二次离子质谱（TOF-SIMS）
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X射线光电子能谱（XPS光谱）

XPS (ESCA) determines quantitative atomic composition & chemical states.

X射线光电子能谱（XPS光谱）
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傅里叶变换红外光谱（FTIR）

FTIR spectroscopy rapidly identifies chemical functional groups in materials.

傅里叶变换红外光谱（FTIR）
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凝胶渗透色谱（GPC）

GPC characterizes polymers & macromolecules in mixtures.

凝胶渗透色谱（GPC）
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全反射X射线荧光（TXRF）

TXRF detects surface metal contaminants on polished wafers using low-angle X-ray excitation.

全反射X射线荧光（TXRF）
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残余气体分析（RGA）

Analyzing internal gas composition prevents microelectronic failures from corrosion.

残余气体分析（RGA）
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X射线衍射（XRD）

XRD is a powerful non-destructive technique for crystalline material characterization.

X射线衍射（XRD）
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俄歇电子能谱 (AES)

Auger analysis is a surface-sensitive technique for elemental microanalysis.

俄歇电子能谱 (AES)
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能量色散X射线光谱学 (EDS)

Contact us for EDS technology - an analytical technique coupled with SEM/TEM/STEM for elemental composition.

能量色散X射线光谱学 (EDS)
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聚焦离子束 (FIB)

FIB uses focused ion beams for sample modification/imaging, preparing specimens for SEM/STEM/TEM analysis.

聚焦离子束 (FIB)
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气相色谱-质谱法 (GC-MS)

Contact EAG for reliable GC-MS analysis outsourcing with expert interpretation.

气相色谱-质谱法 (GC-MS)
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辉光放电质谱法 (GDMS)

Contact EAG for GDMS services analyzing metals, alloys & graphite inorganic solids.

辉光放电质谱法 (GDMS)
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电感耦合等离子体质谱 (ICP-MS)

ICP-MS quantitatively measures nearly all elements' concentrations.

电感耦合等离子体质谱 (ICP-MS)
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仪器气体分析 (IGA)

IGA measures gas-forming elements (C,H,O,N,S) in solids from ppm to % levels.

仪器气体分析 (IGA)
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扫描电子显微镜 (SEM)

Leverage EAG's expertise in high-resolution SEM imaging for surface/near-surface analysis.

扫描电子显微镜 (SEM)
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二次离子质谱法 (SIMS)

Contact EAG for SIMS analysis to detect dopants, impurities & precise layer profiling.

二次离子质谱法 (SIMS)
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透射电子显微镜 (TEM)

EAG's TEM/STEM enables nanoscale chemical analysis.

透射电子显微镜 (TEM)
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附加技术 (SMART)

Explore more technologies on our website.

附加技术 (SMART)
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