微量元素分析

Concentrations at the parts-per-ten-thousand level.

Even such small amounts of undesirable contaminants can affect the properties of materials in terms of physical, electrical, or other characteristics. There are numerous stages in material processing where chemical contamination may be introduced, which can adversely impact the performance of both the materials and the final products.

For today’s materials engineers, controlling and understanding the effects of chemical contamination on advanced materials is critical, and this can be achieved through trace element analysis. Systematically inspecting raw materials before production and conducting continuous testing at key stages of manufacturing helps identify and eliminate sources of unwanted impurities in the final product.

EAG offers a variety of techniques to determine trace or ultratrace impurities in a wide range of advanced materials. By collaborating with clients, we develop optimal methods to deliver the most relevant, reliable, accurate, and reproducible data while reducing turnaround time. Techniques of particular interest for trace element analysis include GDMS, ICP-MS, ICP-OES, IGA, XRF, TXRF, atomic absorption, and SIMS. EAG will assist in determining the right method based on your specific requirements and sample type.